Flyer: Calibration and capability artefacts for SFP2 surface finish probe (pdf)

文件大小: 606 kB 语言: English 订货号: H-1000-2500

Surface finish measurement has traditionally involved the use of hand-held sensors or has required the part to be moved onto a costly dedicated measuring machine. The SFP2 probe for the REVO® 5-axis system changes all this, making surface finish inspection an integral part of CMM measurement, enabling the automatic switching between scanning, optical non-contact and surface finish measurement probe types.

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