成像选件及取样附件

The unique flexibility of the inVia Raman microscope enables us to accommodate the widest range of imaging options and accessories. This flexibility plays a vital role in unleashing the power of Raman spectroscopy to solve a wide range of analytical challenges. Whether your requirements are for global Raman imaging, remote measurements, in situ sampling at non-ambient conditions or simply an objective with a longer working distance, we have a range of accessories to satisfy your requirements.

In the event that your requirements are highly specialised, we have the experience and capabilities to design and implement customised solutions to satisfy these needs.

Imaging options

The inVia Raman microscope supports a variety of Raman mapping and imaging options.

• StreamLine™ imaging - Raman spectrum collected at every point. Simultaneous stage movement and CCD readout with zero dead-time between sequential data collections. Benefits from lower laser power density than spot imaging.
• Point imaging - Raman spectrum collected at every point. Spatial information achieved by sample stage movement. Illumination is from laser spot.
• Rapid line focus imaging - Raman spectrum collected at every point. Spatial information achieved by a combination of stage movement and CCD image binning. Benefits from lower laser power density than spot imaging.
• Global Raman imaging - Discrete wavelengths imaged in every acquisition. Spatial information derived from image projected onto CCD.

Please consult your local Renishaw Raman representative for advice on the best technqiue for your applications

Selected publications

Defining a strategy for chemical imaging of industrial pharmaceutical samples on Raman line-mapping and global illumination instruments (2006), Donald Clark et al, Applied Spectroscopy, 60, 494-502

Direct Raman Imaging techniques for study of the subcelluar distribution of a drug (2002), J Ling et al, Applied Optics, 41, 6006-6017

Crosshatching on a SiGe film grown on a Si(001) substrate studied by Raman mapping and atomic force microscopy (2002), H Chen, The American Physical Society, 65, 233303-1 to 4

Sampling accessories

We support and supply a large range of sampling accessories. They can be categorised into two main groups; accessories for controlling the sample environment, and accessories such as specialised objectives and remote probes to suit particluar sampling geometries.