纳米压痕

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• Application note: Indentation and Raman spectroscopy combined [en]

  Combine the power of inVia™ with nanoindentation measurements and directly correlate mechanical and tribological properties with chemical information such as crystallinity, polymorphism, phase and stress/strain. Raman spectroscopy is a powerful technique commonly used to study the composition, uniformity, strain, stress and disorder of materials. However, it does not directly characterise physical, mechanical and tribological properties. Renishaw and Hysitron have combined an inVia confocal Raman microscope with a TI 950 TriboIndenter, producing a system with the capability to directly correlate mechanical property measurements with comprehensive chemical analyses, in situ.

  

  Application note: Indentation and Raman spectroscopy combined

  Combine the power of inVia™ with nanoindentation measurements and directly correlate mechanical and tribological properties with chemical information such as crystallinity, polymorphism, phase and stress/strain. Raman spectroscopy is a powerful technique commonly used to study the composition, uniformity, strain, stress and disorder of materials. However, it does not directly characterise physical, mechanical and tribological properties. Renishaw and Hysitron have combined an inVia confocal Raman microscope with a TI 950 TriboIndenter, producing a system with the capability to directly correlate mechanical property measurements with comprehensive chemical analyses, in situ.

  [229kB]
• News release: Combined Raman spectroscopy and nanoindentation assessment of complex materials [en]

  An article in the July/August 2016 issue of Microscopy and Analysis presents a new system that physically couples a Raman spectroscopy system with a nanoindenter on a shared stage that uniquely enables combined assessment of materials with submicrometre spatial resolution at single sites or spanning millimetre-sized regions.

  

  News release: Combined Raman spectroscopy and nanoindentation assessment of complex materials

  An article in the July/August 2016 issue of Microscopy and Analysis presents a new system that physically couples a Raman spectroscopy system with a nanoindenter on a shared stage that uniquely enables combined assessment of materials with submicrometre spatial resolution at single sites or spanning millimetre-sized regions.

  [2.2MB]