Product note: inVia™ confocal Raman microscope and Dimension AFM integration [en]
The integration of the inVia confocal Raman microscope with the Dimension series AFMs combines industry leading instruments to provide a solution that gives the best possible performance:
Product note: Renishaw Raman-AFM/TERS solutions [en]
Product note - Combined Raman/AFM (atomic force microscope) systems are excellent for characterising the properties of materials at sub-micrometre, and potentially nanometre, scales.Tip-enhanced Raman scattering (TERS) provides chemical imaging at the nanometre scale, enabling you to take your research to a whole new level.
Product note: Co-located SEM-Raman imaging system [en]
Renishaw’s SEM-Raman system provides truly co-located analysis Renishaw’s SEM-Raman system is unique. You can simultaneously acquire both SEM (scanning electron microscope) and Raman data from the same area on the sample. You do not have to transfer the sample to a different measurement location or instrument; this ensures rapid truly correlative analysis. You will avoid the sample registration issues that can occur when moving samples between measurement locations.[407kB]
Product note: SCA - diamond composite analysis [en]
Renishaw’s structural and chemical analyser unites two well-established technologies, scanning electron microscopy (SEM) and Raman spectroscopy, resulting in a powerful new technique which allows morphological, elemental, chemical, physical, and electronic analysis without moving the sample between instruments.[138kB]
Application note: A study of single-wall carbon nanotubes using Renishaw's structural and chemical analyser for scanning electron microscopy [en]
Electron imaging and Raman spectroscopy are established techniques for viewing and analysing carbon nanotubes. Performing these two techniques usually requires the sample being transferred between a scanning electron microscope (SEM) and a Raman spectrometer. This application note illustrates the advantages of Renishaw’s structural and chemical analyser (SCA) for simultaneous secondary electron imaging and Raman spectroscopy of single-wall carbon nanotubes (SWNTs).[357kB]
Application note: SCA oxidation application note - cultural heritage [en]
SEM-SCA analysis helps in the preservation of a corroding bronze statue of the Roman god Ares from the ancient city of Zeugma in Turkey.[354kB]
Application note: Indentation and Raman spectroscopy combined [en]
Combine the power of inVia™ with nanoindentation measurements and directly correlate mechanical and tribological properties with chemical information such as crystallinity, polymorphism, phase and stress/strain. Raman spectroscopy is a powerful technique commonly used to study the composition, uniformity, strain, stress and disorder of materials. However, it does not directly characterise physical, mechanical and tribological properties. Renishaw and Hysitron have combined an inVia confocal Raman microscope with a TI 950 TriboIndenter, producing a system with the capability to directly correlate mechanical property measurements with comprehensive chemical analyses, in situ.
News release: Combined Raman spectroscopy and nanoindentation assessment of complex materials [en]
An article in the July/August 2016 issue of Microscopy and Analysis presents a new system that physically couples a Raman spectroscopy system with a nanoindenter on a shared stage that uniquely enables combined assessment of materials with submicrometre spatial resolution at single sites or spanning millimetre-sized regions.
使用原子力显微镜 (AFM) 和inVia的3D拉曼成像能力，揭示关于神经胶质瘤细胞组成的详细和互补信息。具有纳米尺度空间分辨率的AFM形貌图不仅可以清晰地分辨细胞结构，而且可以分辨它们的化学成分。通过将AFM形貌图与3D拉曼图像提供的额外化学信息进行比较和关联，研究者可以更深入地了解细胞。
利用inVia和TERS分析微小的样品体积和微弱的拉曼散射。针尖增强拉曼光谱 (TERS) 使用特殊的等离子体针尖增大样品的电场，进而提高拉曼强度。这些针尖非常小，直径为10 nm至100 nm不等，通过利用扫描探针显微镜 (SPM) 或原子力显微镜 (AFM) 握持针尖接触样品。